Towards faster control of paper machine by dry line measurement

A.J. Niemi, J. Berndtson, S. Karine

    Research output: Chapter in Book/Report/Conference proceedingConference contributionScientificpeer-review

    Original languageEnglish
    Title of host publicationXIV IMEKO WORLD CONGRESS - CD Symposium '97, Tampere, Finland, 4-5 June 1997
    EditorsJ. Halttunen, T. R. Nyberg, R. Ritala
    Place of PublicationHelsinki, Finland
    PublisherFinnish Society of Automation
    PagesVol. XB, pp.214-219
    Publication statusPublished - 1997
    MoE publication typeA4 Article in a conference publication

    Keywords

    • basis weight
    • dry line
    • image processing
    • paper machine control

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