Toward comprehensive reliability testing of electronic component boards

Toni T. Mattila, Mervi Paulasto-Kröckel

Research output: Chapter in Book/Report/Conference proceedingConference contributionScientificpeer-review

Original languageEnglish
Title of host publication11th Conference on Thermal, Mechanical and Multiphysics Simulation and Experiments in Micro/Nanoelectronics and Systems (EuroSimE), Bordeaux, France, April 26-28, 2010
PublisherIEEE CPMT
Pages15-27
Publication statusPublished - 2010
MoE publication typeA4 Article in a conference publication

Cite this