Topography and work function measurements of thin MgO(001) films on Ag(001) by nc-AFM and KPFM

M. Bieletzki, T. Hynninen, T.M. Soini, M. Pivetta, C.R. Henry, A.S. Foster, F. Esch, C. Barth, U. Heiz

Research output: Contribution to journalArticleScientificpeer-review

64 Citations (Scopus)
Original languageEnglish
Pages (from-to)3203-3209
Number of pages7
JournalPhysical Chemistry Chemical Physics
Volume12
Issue number13
DOIs
Publication statusPublished - 2010
MoE publication typeA1 Journal article-refereed

Keywords

  • Kelvin probe
  • KPFM
  • nc-AFM
  • tip change
  • topography
  • work function

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