@article{e11b4006c2a44f41969ad30349a6af1e,
title = "Topography and work function measurements of thin MgO(001) films on Ag(001) by nc-AFM and KPFM",
keywords = "Kelvin probe, KPFM, nc-AFM, tip change, topography, work function, Kelvin probe, KPFM, nc-AFM, tip change, topography, work function, Kelvin probe, KPFM, nc-AFM, tip change, topography, work function",
author = "M. Bieletzki and T. Hynninen and T.M. Soini and M. Pivetta and C.R. Henry and A.S. Foster and F. Esch and C. Barth and U. Heiz",
year = "2010",
doi = "10.1039/b923296f",
language = "English",
volume = "12",
pages = "3203--3209",
journal = "Physical Chemistry Chemical Physics",
issn = "1463-9076",
number = "13",
}