Top-down deep appearance attention for action recognition

Rao Muhammad Anwer^*, Fahad Shahbaz Khan, Joost van de Weijer, Jorma Laaksonen

^*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceeding › Conference article in proceedings › Scientific › peer-review

1 Citation (Scopus)

1 results
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Science-IT
Mikko Hakala (Manager)
School of Science
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