Tip and surface properties from the distance dependence of tip-surface interactions

A. S. Foster*, L. N. Kantorovich, A. L. Shluger

*Corresponding author for this work

Research output: Contribution to journalArticleScientificpeer-review

10 Citations (Scopus)

Abstract

Macroscopic "background" interactions, such as van der Waals and electrostatic forces, determine the frequency change in non-contact atomic force microscopy (NC-AFM). We demonstrate that by analysing the distance dependence of these interactions one can extract more information about the tip radius, charge and chemical composition, as well as about the surface charging and conductivity. For this purpose we calculate the interaction of different NC-AFM tips with a charged and neutral CaF2 (111) surface and with an ideal metal surface. Force versus distance curves demonstrate a remarkably different behaviour, especially at long distances, dependent on whether the tip is conductive, oxidised or charged. Comparison with experimental curves proves that this analysis can predict tip properties.

Original languageEnglish
Pages (from-to)S59–S62
Number of pages4
JournalAPPLIED PHYSICS A-MATERIALS SCIENCE AND PROCESSING
Volume72
Issue numberSuppl. 1
DOIs
Publication statusPublished - 2001
MoE publication typeA1 Journal article-refereed

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