Tiled wing induced stress distribution in epitaxiallateral ovegrown GaN

W.M. Chen, P.J. McNally, K. Jacobs, Turkka Tuomi, J. Kanatharana, D. Lowney, L. Knuuttila, J. Riikonen, J. Toivonen

    Research output: Contribution to journalArticleScientificpeer-review

    3 Citations (Scopus)
    Original languageEnglish
    Pages (from-to)283-286
    JournalJournal of Materials Science: Materials in Electronics
    Issue number14
    Publication statusPublished - 2003
    MoE publication typeA1 Journal article-refereed

    Keywords

    • GaN
    • strain
    • synchrotron x-ray topography

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