@article{3259953d521a4e73af393783b1a2baa7,
title = "Tiled wing induced stress distribution in epitaxiallateral ovegrown GaN",
keywords = "GaN, strain, synchrotron x-ray topography, GaN, strain, synchrotron x-ray topography, GaN, strain, synchrotron x-ray topography",
author = "W.M. Chen and P.J. McNally and K. Jacobs and Turkka Tuomi and J. Kanatharana and D. Lowney and L. Knuuttila and J. Riikonen and J. Toivonen",
year = "2003",
language = "English",
pages = "283--286",
journal = "Journal of Materials Science: Materials in Electronics",
issn = "0957-4522",
publisher = "Springer New York",
number = "14",
}