@article{1d057b61e5d94bd68595ae5116277875,
title = "Thickness measurement of thin polymer films by total internal reflection Raman and attenuated total reflection infrared spectroscopy",
keywords = "Attenuated total reflection infrared spectroscopy, ellipsometry, thickness, Thin film, Total internal reflection Raman spectroscopy, ultra-thin film, Attenuated total reflection infrared spectroscopy, ellipsometry, thickness, Thin film, Total internal reflection Raman spectroscopy, ultra-thin film, Attenuated total reflection infrared spectroscopy, ellipsometry, thickness, Thin film, Total internal reflection Raman spectroscopy, ultra-thin film",
author = "Antti Kivioja and Anna-Stiina J{\"a}{\"a}skel{\"a}inen and Ville Ahtee and Tapani Vuorinen",
year = "2012",
doi = "10.1016/j.vibspec.2012.02.014",
language = "English",
pages = "1--9",
journal = "Vibrational Spectroscopy",
issn = "0924-2031",
publisher = "Elsevier",
number = "31",
}