Thermal Relaxation in Titanium Nanowires: Signatures of Inelastic Electron-Boundary Scattering in Heat Transfer

Teemu Elo, Pasi Lähteenmäki, Dmitri Golubev, Alexander Savin, Konstantin Arutyunov, Pertti Hakonen*

*Corresponding author for this work

Research output: Contribution to journalArticleScientificpeer-review

6 Citations (Scopus)
78 Downloads (Pure)

Abstract

We have employed noise thermometry for investigations of thermal relaxation between the electrons and the substrate in nanowires patterned from 40-nm-thick titanium film on top of silicon wafers covered by a native oxide. By controlling the electronic temperature (Formula presented.) by Joule heating at the base temperature of a dilution refrigerator, we probe the electron–phonon coupling and the thermal boundary resistance at temperatures (Formula presented.)–3 K. Using a regular (Formula presented.)-dependent electron–phonon coupling of clean metals and a (Formula presented.)-dependent interfacial heat flow, we deduce a small contribution for the direct energy transfer from the titanium electrons to the substrate phonons due to inelastic electron-boundary scattering.

Original languageEnglish
Pages (from-to)204–216
Number of pages13
JournalJournal of Low Temperature Physics
Volume189
Issue number3-4
DOIs
Publication statusPublished - 16 Aug 2017
MoE publication typeA1 Journal article-refereed

Keywords

  • Electron-phonon coupling
  • Electronic Kapitza conductance
  • Kapitza resistance
  • Shot noise thermometry
  • Thermal contact
  • Thermal relaxation
  • Titanium

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