Thermal Relaxation in Titanium Nanowires: Signatures of Inelastic Electron-Boundary Scattering in Heat Transfer

Research output: Contribution to journalArticleScientificpeer-review

Researchers

Research units

  • Russian Academy of Sciences
  • Moscow Institute of Electronics and Mathematics

Abstract

We have employed noise thermometry for investigations of thermal relaxation between the electrons and the substrate in nanowires patterned from 40-nm-thick titanium film on top of silicon wafers covered by a native oxide. By controlling the electronic temperature (Formula presented.) by Joule heating at the base temperature of a dilution refrigerator, we probe the electron–phonon coupling and the thermal boundary resistance at temperatures (Formula presented.)–3 K. Using a regular (Formula presented.)-dependent electron–phonon coupling of clean metals and a (Formula presented.)-dependent interfacial heat flow, we deduce a small contribution for the direct energy transfer from the titanium electrons to the substrate phonons due to inelastic electron-boundary scattering.

Details

Original languageEnglish
Pages (from-to)204–216
Number of pages13
JournalJournal of Low Temperature Physics
Volume189
Issue number3-4
Publication statusPublished - 16 Aug 2017
MoE publication typeA1 Journal article-refereed

    Research areas

  • Electron-phonon coupling, Electronic Kapitza conductance, Kapitza resistance, Shot noise thermometry, Thermal contact, Thermal relaxation, Titanium

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ID: 14874617