Thermal Creation of Defects in GaTe

A. Zubiaga, J.A. Garcia, F. Plazaola, V. Muñoz-Sanjose, C. Martinez-Tomas

Research output: Contribution to journalArticleScientificpeer-review

Original languageEnglish
JournalJapanese Journal of Applied Physics
Volume47
Publication statusPublished - 2008
MoE publication typeA1 Journal article-refereed

Keywords

  • GaTe, laminar semiconductor, infrared photoluminescence, annealing

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