Thermal characterisation as a part of reliability testing of THz Schottky diodes

Tero Kiuru, Subash Khanal, Juha Mallat, Antti V. Räisänen, Tapani Närhi

Research output: Chapter in Book/Report/Conference proceedingConference contributionScientific

Original languageEnglish
Title of host publicationXXXIII Finnish URSI Convention on Radio Science and SMARAD Seminar, Espoo, Finland, April 24-25, 2013
EditorsHenrik Wallén, Ari Sihvola
Place of PublicationEspoo, Finland
PublisherURSI Finnish National Committee and SMARAD
Pages121-123
Publication statusPublished - 2013
MoE publication typeB3 Non-refereed article in conference proceedings

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