Theoretical studies of interstitial boron defects in silicon

M. Hakala, M.J. Puska, R.M. Nieminen

Research output: Working paperProfessional

Original languageEnglish
Pages268-270
Publication statusPublished - 1999
MoE publication typeD4 Published development or research report or study

Publication series

NameThe 20th International Conference on Defects in Semiconductors, Berkeley, USA, 26.-30.7.1999

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