The role of the tip in non-contact atomic force microscopy dissipation images of ionic surfaces

Research output: Contribution to journalArticleScientificpeer-review

Researchers

Research units

  • Tampere University of Technology

Details

Original languageEnglish
Article number045702
Number of pages9
JournalNanotechnology
Volume22
Issue number4
Publication statusPublished - Jan 2011
MoE publication typeA1 Journal article-refereed

    Research areas

  • AFM

ID: 946962