The Impact of Subsrate Quality on the Reliablity of SiC Photodiode Operation

T. Tuomi, P.J McNally, L. "O'Reilly", J. Riikonen, P. Bergman, H. Jacobson, C. Hallin

    Research output: Working paperProfessional

    Original languageEnglish
    Place of PublicationHampuri
    Publication statusPublished - 2004
    MoE publication typeD4 Published development or research report or study

    Publication series

    NameHASYLAB Annual Report 2004


    • silicon carbide
    • synchrotron x-ray topography

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