The Effects of Prolonged Scanning on the Oxidized Stainless Steel Substrate during Scanning Tunneling Microscopy

K.A. Pischow, A.S. Korhonen, E.O. Ristolainen

    Research output: Chapter in Book/Report/Conference proceedingConference contributionScientificpeer-review

    Original languageEnglish
    Title of host publicationIVC-12/ICSS-8 Congress, 12-16 Oct., 1992, The Hague, The Netherlands
    Publication statusPublished - 1992
    MoE publication typeA4 Article in a conference publication

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