The effects of prolonged high-voltage STM scanning on an oxidized silicon wafer surface

Kaj Pischow, J.M. Molarius

Research output: Contribution to journal › Article › Scientific › peer-review

3 Citations (Scopus)

Keywords

@article{f9a59d86616a4401b715ebaef365cfdc,

title = "The effects of prolonged high-voltage STM scanning on an oxidized silicon wafer surface",

keywords = "silicon wafers, stm, silicon wafers, stm, silicon wafers, stm",

author = "Kaj Pischow and J.M. Molarius",

year = "1994",

language = "English",

pages = "80--86",

journal = "Nanotechnology",

issn = "1361-6528",

publisher = "Institute of Physics Publishing",

number = "5",

}