Terahertz-infrared spectroscopy of wafer-scale films of single-walled carbon nanotubes treated by plasma

S. S. Zhukov; E. S. Zhukova; A. V. Melentev; B. P. Gorshunov; A. P. Tsapenko; D. S. Kopylova; Albert G. Nasibulin

doi:10.1016/j.carbon.2021.12.076

Terahertz-infrared spectroscopy of wafer-scale films of single-walled carbon nanotubes treated by plasma

S. S. Zhukov^*, E. S. Zhukova, A. V. Melentev, B. P. Gorshunov, A. P. Tsapenko, D. S. Kopylova, Albert G. Nasibulin

^*Corresponding author for this work

Research output: Contribution to journal › Article › Scientific › peer-review

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Abstract

We investigated terahertz-infrared electrodynamic properties of wafer-scale films composed of plasma-treated single-walled carbon nanotubes (SWCNTs) and films comprising SWCNTs grown with different lengths. The spectra of complex conductance of the films were measured at frequencies 5–20 000 cm⁻¹ and in the temperature interval 5–300 K. Terahertz spectral response of films of pristine SWCNTs is well described with the Drude conductivity model and a plasmon resonance located at ≈100 cm⁻¹. Stepwise treatment of the films with oxygen plasma led to a gradual suppression of the Drude spectral weight from the low-frequency side. For films with the nanotubes shorter than 1 μm, i.e., close to electrons mean free path and localization length, scattering of charge carriers at the nanotubes edges is shown to additionally contribute to the carriers scattering rate and to the damping of plasmon resonance. The temperature coefficient of ac resistance (ac TCR) in both kinds of films is found to strongly increase in amplitude during cooling and frequency decrease. The values of ac TCR increase in films with longer time of plasma treatment and nanotubes with shorter length but reach saturation in films with exposure time longer than ≈100 s or composed from SWCNTs shorter than 1 μm.

Original language	English
Pages (from-to)	413-421
Number of pages	9
Journal	Carbon
Volume	189
Early online date	25 Dec 2021
DOIs	https://doi.org/10.1016/j.carbon.2021.12.076
Publication status	Published - 15 Apr 2022
MoE publication type	A1 Journal article-refereed

Keywords

Carbon nanotubes
Plasma treatment
Temperature coefficient of resistance
Terahertz spectroscopy
Thin films

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10.1016/j.carbon.2021.12.076

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@article{8bd0d1fe58844aa6b10bf90bee298821,

title = "Terahertz-infrared spectroscopy of wafer-scale films of single-walled carbon nanotubes treated by plasma",

abstract = "We investigated terahertz-infrared electrodynamic properties of wafer-scale films composed of plasma-treated single-walled carbon nanotubes (SWCNTs) and films comprising SWCNTs grown with different lengths. The spectra of complex conductance of the films were measured at frequencies 5–20 000 cm−1 and in the temperature interval 5–300 K. Terahertz spectral response of films of pristine SWCNTs is well described with the Drude conductivity model and a plasmon resonance located at ≈100 cm−1. Stepwise treatment of the films with oxygen plasma led to a gradual suppression of the Drude spectral weight from the low-frequency side. For films with the nanotubes shorter than 1 μm, i.e., close to electrons mean free path and localization length, scattering of charge carriers at the nanotubes edges is shown to additionally contribute to the carriers scattering rate and to the damping of plasmon resonance. The temperature coefficient of ac resistance (ac TCR) in both kinds of films is found to strongly increase in amplitude during cooling and frequency decrease. The values of ac TCR increase in films with longer time of plasma treatment and nanotubes with shorter length but reach saturation in films with exposure time longer than ≈100 s or composed from SWCNTs shorter than 1 μm.",

keywords = "Carbon nanotubes, Plasma treatment, Temperature coefficient of resistance, Terahertz spectroscopy, Thin films",

author = "Zhukov, {S. S.} and Zhukova, {E. S.} and Melentev, {A. V.} and Gorshunov, {B. P.} and Tsapenko, {A. P.} and Kopylova, {D. S.} and Nasibulin, {Albert G.}",

note = "Funding Information: The authors acknowledge Mogorychnaya A.V. for assistance with spectroscopic experiments. The research was supported by the Russian Science Foundation , grant RSF21-72-20050 (spectroscopic measurments and analysis of carbon nanotubes films). D.S.K. and A.G.N. acknowledge Russian Foundation of Basic Research project No. 20-03-00804 (synthesis, characterization and plasma treatment of carbon nanotubes). A.P.T. acknowledges the EDUFI Fellowship (No. TM-19-11079) from the Finnish National Agency for Education and the Magnus Ehrnrooth Foundation (the Finnish Society of Sciences and Letters ) for personal financial support. Publisher Copyright: {\textcopyright} 2021 Elsevier Ltd",

year = "2022",

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doi = "10.1016/j.carbon.2021.12.076",

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T1 - Terahertz-infrared spectroscopy of wafer-scale films of single-walled carbon nanotubes treated by plasma

AU - Zhukov, S. S.

AU - Zhukova, E. S.

AU - Melentev, A. V.

AU - Gorshunov, B. P.

AU - Tsapenko, A. P.

AU - Kopylova, D. S.

AU - Nasibulin, Albert G.

N1 - Funding Information: The authors acknowledge Mogorychnaya A.V. for assistance with spectroscopic experiments. The research was supported by the Russian Science Foundation , grant RSF21-72-20050 (spectroscopic measurments and analysis of carbon nanotubes films). D.S.K. and A.G.N. acknowledge Russian Foundation of Basic Research project No. 20-03-00804 (synthesis, characterization and plasma treatment of carbon nanotubes). A.P.T. acknowledges the EDUFI Fellowship (No. TM-19-11079) from the Finnish National Agency for Education and the Magnus Ehrnrooth Foundation (the Finnish Society of Sciences and Letters ) for personal financial support. Publisher Copyright: © 2021 Elsevier Ltd

PY - 2022/4/15

Y1 - 2022/4/15

N2 - We investigated terahertz-infrared electrodynamic properties of wafer-scale films composed of plasma-treated single-walled carbon nanotubes (SWCNTs) and films comprising SWCNTs grown with different lengths. The spectra of complex conductance of the films were measured at frequencies 5–20 000 cm−1 and in the temperature interval 5–300 K. Terahertz spectral response of films of pristine SWCNTs is well described with the Drude conductivity model and a plasmon resonance located at ≈100 cm−1. Stepwise treatment of the films with oxygen plasma led to a gradual suppression of the Drude spectral weight from the low-frequency side. For films with the nanotubes shorter than 1 μm, i.e., close to electrons mean free path and localization length, scattering of charge carriers at the nanotubes edges is shown to additionally contribute to the carriers scattering rate and to the damping of plasmon resonance. The temperature coefficient of ac resistance (ac TCR) in both kinds of films is found to strongly increase in amplitude during cooling and frequency decrease. The values of ac TCR increase in films with longer time of plasma treatment and nanotubes with shorter length but reach saturation in films with exposure time longer than ≈100 s or composed from SWCNTs shorter than 1 μm.

AB - We investigated terahertz-infrared electrodynamic properties of wafer-scale films composed of plasma-treated single-walled carbon nanotubes (SWCNTs) and films comprising SWCNTs grown with different lengths. The spectra of complex conductance of the films were measured at frequencies 5–20 000 cm−1 and in the temperature interval 5–300 K. Terahertz spectral response of films of pristine SWCNTs is well described with the Drude conductivity model and a plasmon resonance located at ≈100 cm−1. Stepwise treatment of the films with oxygen plasma led to a gradual suppression of the Drude spectral weight from the low-frequency side. For films with the nanotubes shorter than 1 μm, i.e., close to electrons mean free path and localization length, scattering of charge carriers at the nanotubes edges is shown to additionally contribute to the carriers scattering rate and to the damping of plasmon resonance. The temperature coefficient of ac resistance (ac TCR) in both kinds of films is found to strongly increase in amplitude during cooling and frequency decrease. The values of ac TCR increase in films with longer time of plasma treatment and nanotubes with shorter length but reach saturation in films with exposure time longer than ≈100 s or composed from SWCNTs shorter than 1 μm.

KW - Carbon nanotubes

KW - Plasma treatment

KW - Temperature coefficient of resistance

KW - Terahertz spectroscopy

KW - Thin films

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U2 - 10.1016/j.carbon.2021.12.076

DO - 10.1016/j.carbon.2021.12.076

M3 - Article

AN - SCOPUS:85122027665

SN - 0008-6223

VL - 189

SP - 413

EP - 421

JO - Carbon

JF - Carbon

ER -

Terahertz-infrared spectroscopy of wafer-scale films of single-walled carbon nanotubes treated by plasma

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Keywords

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