@article{f9d58fb91df9415e86102799795e9d55,
title = "Temperature-tunable silicon-wafer etalon for frequency-chirp measurements",
keywords = "diagnostic measurements, Fabry-Perot etalon, optical telecommunication, wavelength-division multiplexing, diagnostic measurements, Fabry-Perot etalon, optical telecommunication, wavelength-division multiplexing, diagnostic measurements, Fabry-Perot etalon, optical telecommunication, wavelength-division multiplexing",
author = "T. Niemi and S. Tammela and T. Kajava and M. Kaivola and H. Ludvigsen",
year = "1999",
month = feb,
day = "5",
doi = "10.1002/(SICI)1098-2760(19990205)20:3<190::AID-MOP13>3.0.CO;2-N",
language = "English",
volume = "20",
pages = "190--192",
journal = "Microwave and Optical Technology Letters",
issn = "0895-2477",
publisher = "Wiley",
number = "3",
}