Temperature-tunable silicon-wafer etalon for frequency-chirp measurements

T. Niemi, S. Tammela, T. Kajava, M. Kaivola, H. Ludvigsen

Research output: Contribution to journalArticleScientificpeer-review

4 Citations (Scopus)
Original languageEnglish
Pages (from-to)190-192
Number of pages3
JournalMicrowave and Optical Technology Letters
Volume20
Issue number3
DOIs
Publication statusPublished - 5 Feb 1999
MoE publication typeA1 Journal article-refereed

Keywords

  • diagnostic measurements
  • Fabry-Perot etalon
  • optical telecommunication
  • wavelength-division multiplexing

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