Cryoresistors based on Pd thin films were designed and investigated in the temperature range 50 mK-300 K. The resistors in the range 100 kΩ-1.3 MΩ were fabricated by thermal evaporation technique. Resistivity of Pd film at 293 K varies in (21-53) · 10-8 Ωm range for 15-40 nm films. Temperature coefficient of resistance at low temperatures depends on the thickness of the film. The lowest temperature coefficient in the range 3 K-4 K of about few parts in 106/K was obtained for 20-nm-thick film. Current coefficient measured on 20-nm-thin film 1.002-MΩ resistor does not exceed 2 · 10-5/μA in 0.7 K-1 K temperature range.
|Number of pages||6|
|Journal||IEEE Transactions on Instrumentation and Measurement|
|Publication status||Published - Jul 2011|
|MoE publication type||A1 Journal article-refereed|
- low temperature
- resistance measurement
- thin-film resistors