TEM verification of optical diameter distribution analysis for nitrogen-doped SWCNT films

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TEM verification of optical diameter distribution analysis for nitrogen-doped SWCNT films. / Susi, T.; Zhu, Z.; Tian, Y.; Nasibulin, A.G.; Jiang, H.; Kauppinen, E.I.

In: Journal of Nanoelectronics and Optoelectronics, Vol. 7, No. 1, 2012, p. 17-21.

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@article{e4689e49256740b38e335280e0c49e7e,
title = "TEM verification of optical diameter distribution analysis for nitrogen-doped SWCNT films",
keywords = "tubes, tubes, tubes",
author = "T. Susi and Z. Zhu and Y. Tian and A.G. Nasibulin and H. Jiang and E.I. Kauppinen",
year = "2012",
doi = "10.1166/jno.2012.1209",
language = "English",
volume = "7",
pages = "17--21",
journal = "Journal of Nanoelectronics and Optoelectronics",
issn = "1555-130X",
publisher = "American Scientific Publishers",
number = "1",

}

RIS - Download

TY - JOUR

T1 - TEM verification of optical diameter distribution analysis for nitrogen-doped SWCNT films

AU - Susi, T.

AU - Zhu, Z.

AU - Tian, Y.

AU - Nasibulin, A.G.

AU - Jiang, H.

AU - Kauppinen, E.I.

PY - 2012

Y1 - 2012

KW - tubes

KW - tubes

KW - tubes

UR - http://dx.doi.org/10.1166/jno.2012.1209

U2 - 10.1166/jno.2012.1209

DO - 10.1166/jno.2012.1209

M3 - Article

VL - 7

SP - 17

EP - 21

JO - Journal of Nanoelectronics and Optoelectronics

JF - Journal of Nanoelectronics and Optoelectronics

SN - 1555-130X

IS - 1

ER -

ID: 737298