TEM verification of optical diameter distribution analysis for nitrogen-doped SWCNT films

T. Susi; Z. Zhu; Y. Tian; A.G. Nasibulin; H. Jiang; E.I. Kauppinen

doi:10.1166/jno.2012.1209

TEM verification of optical diameter distribution analysis for nitrogen-doped SWCNT films

T. Susi, Z. Zhu, Y. Tian, A.G. Nasibulin, H. Jiang, E.I. Kauppinen

Research output: Contribution to journal › Article › Scientific › peer-review

1 Citation (Scopus)

Original language	English
Pages (from-to)	17-21
Journal	Journal of Nanoelectronics and Optoelectronics
Volume	7
Issue number	1
DOIs	https://doi.org/10.1166/jno.2012.1209
Publication status	Published - 2012
MoE publication type	A1 Journal article-refereed

Keywords

tubes

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10.1166/jno.2012.1209

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title = "TEM verification of optical diameter distribution analysis for nitrogen-doped SWCNT films",

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author = "T. Susi and Z. Zhu and Y. Tian and A.G. Nasibulin and H. Jiang and E.I. Kauppinen",

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language = "English",

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T1 - TEM verification of optical diameter distribution analysis for nitrogen-doped SWCNT films

AU - Susi, T.

AU - Zhu, Z.

AU - Tian, Y.

AU - Nasibulin, A.G.

AU - Jiang, H.

AU - Kauppinen, E.I.

PY - 2012

Y1 - 2012

KW - tubes

UR - http://dx.doi.org/10.1166/jno.2012.1209

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DO - 10.1166/jno.2012.1209

M3 - Article

SN - 1555-130X

VL - 7

SP - 17

EP - 21

JO - Journal of Nanoelectronics and Optoelectronics

JF - Journal of Nanoelectronics and Optoelectronics

IS - 1

ER -

TEM verification of optical diameter distribution analysis for nitrogen-doped SWCNT films

Keywords

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