Synchrotron x-ray topography study of defects in epitaxial GaAs on high-quality Ge

Research output: Contribution to journalArticleScientificpeer-review

Standard

Synchrotron x-ray topography study of defects in epitaxial GaAs on high-quality Ge. / Lankinen, Aapo; Knuuttila, Lauri; Tuomi, Turkka; Kostamo, Pasi; Säynätjoki, Antti; Riikonen, Juha; Lipsanen, Harri; McNally, P.J.; Lu, X.; Sipilä, H.; Vaijärvi, S.; Lumb, D.

In: NUCLEAR INSTRUMENTS AND METHODS IN PHYSICS RESEARCH SECTION A: ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, Vol. 563, No. 1, 01.07.2006, p. 62-65.

Research output: Contribution to journalArticleScientificpeer-review

Harvard

Lankinen, A, Knuuttila, L, Tuomi, T, Kostamo, P, Säynätjoki, A, Riikonen, J, Lipsanen, H, McNally, PJ, Lu, X, Sipilä, H, Vaijärvi, S & Lumb, D 2006, 'Synchrotron x-ray topography study of defects in epitaxial GaAs on high-quality Ge', NUCLEAR INSTRUMENTS AND METHODS IN PHYSICS RESEARCH SECTION A: ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, vol. 563, no. 1, pp. 62-65. https://doi.org/10.1016/j.nima.2006.01.066

APA

Vancouver

Author

Lankinen, Aapo ; Knuuttila, Lauri ; Tuomi, Turkka ; Kostamo, Pasi ; Säynätjoki, Antti ; Riikonen, Juha ; Lipsanen, Harri ; McNally, P.J. ; Lu, X. ; Sipilä, H. ; Vaijärvi, S. ; Lumb, D. / Synchrotron x-ray topography study of defects in epitaxial GaAs on high-quality Ge. In: NUCLEAR INSTRUMENTS AND METHODS IN PHYSICS RESEARCH SECTION A: ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT. 2006 ; Vol. 563, No. 1. pp. 62-65.

Bibtex - Download

@article{ac4567c7f126461cad07b0600b6982fa,
title = "Synchrotron x-ray topography study of defects in epitaxial GaAs on high-quality Ge",
author = "Aapo Lankinen and Lauri Knuuttila and Turkka Tuomi and Pasi Kostamo and Antti S{\"a}yn{\"a}tjoki and Juha Riikonen and Harri Lipsanen and P.J. McNally and X. Lu and H. Sipil{\"a} and S. Vaij{\"a}rvi and D. Lumb",
year = "2006",
month = "7",
day = "1",
doi = "10.1016/j.nima.2006.01.066",
language = "English",
volume = "563",
pages = "62--65",
journal = "NUCLEAR INSTRUMENTS AND METHODS IN PHYSICS RESEARCH SECTION A: ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT",
issn = "0168-9002",
publisher = "Elsevier",
number = "1",

}

RIS - Download

TY - JOUR

T1 - Synchrotron x-ray topography study of defects in epitaxial GaAs on high-quality Ge

AU - Lankinen, Aapo

AU - Knuuttila, Lauri

AU - Tuomi, Turkka

AU - Kostamo, Pasi

AU - Säynätjoki, Antti

AU - Riikonen, Juha

AU - Lipsanen, Harri

AU - McNally, P.J.

AU - Lu, X.

AU - Sipilä, H.

AU - Vaijärvi, S.

AU - Lumb, D.

PY - 2006/7/1

Y1 - 2006/7/1

U2 - 10.1016/j.nima.2006.01.066

DO - 10.1016/j.nima.2006.01.066

M3 - Article

VL - 563

SP - 62

EP - 65

JO - NUCLEAR INSTRUMENTS AND METHODS IN PHYSICS RESEARCH SECTION A: ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT

JF - NUCLEAR INSTRUMENTS AND METHODS IN PHYSICS RESEARCH SECTION A: ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT

SN - 0168-9002

IS - 1

ER -

ID: 3532288