Original language | English |
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Pages (from-to) | 62-65 |
Number of pages | 4 |
Journal | NUCLEAR INSTRUMENTS AND METHODS IN PHYSICS RESEARCH SECTION A: ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT |
Volume | 563 |
Issue number | 1 |
DOIs | |
Publication status | Published - 1 Jul 2006 |
MoE publication type | A1 Journal article-refereed |
Synchrotron x-ray topography study of defects in epitaxial GaAs on high-quality Ge
Aapo Lankinen, Lauri Knuuttila, Turkka Tuomi, Pasi Kostamo, Antti Säynätjoki, Juha Riikonen, Harri Lipsanen, P.J. McNally, X. Lu, H. Sipilä, S. Vaijärvi, D. Lumb
Research output: Contribution to journal › Article › Scientific › peer-review