Synchrotron x-ray topography of III-V semiconductors

T. Tuomi

    Research output: Chapter in Book/Report/Conference proceedingConference contributionScientificpeer-review

    Original languageEnglish
    Title of host publicationSecond International School on Crystal Growth Technology, Zao, Japan, August 24-29, 2000
    EditorsT. Fukuda
    Place of PublicationJapani
    Pages526-548
    Publication statusPublished - 2000
    MoE publication typeA4 Article in a conference publication

    Keywords

    • dislocations
    • semiconductors crystal growth
    • synchrotron x-ray topography

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