Synchrotron x-ray topographic study of dislocations and stacking faults in InAs

Aapo Lankinen, Turkka Tuomi, Juha Riikonen, Lauri Knuuttila, Harri Lipsanen, Markku Sopanen, A. Danilewsky, J. McNally, L. "O'Reilly", Y. Zhilyaev, L. Fedorov, H. Sipilä, S. Vaijärvi, R. Simon, D. Lumb, A. Owens

    Research output: Contribution to journalArticleScientificpeer-review

    1 Citation (Scopus)
    Original languageEnglish
    Pages (from-to)320-327
    Number of pages8
    JournalJournal of Crystal Growth
    Volume283
    Issue number3-4
    DOIs
    Publication statusPublished - 1 Oct 2005
    MoE publication typeA1 Journal article-refereed

    Keywords

    • chloride vapor-phase epitaxy
    • crystal defects
    • semiconducting indium compounds
    • x-ray detectors
    • X-ray topography

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