Synchrotron x-ray topographic study of a 'perfect' silicon crystal

R. Rantamäki, T. Tuomi, P.J. McNally, A.N. Danilewsky, P. Becker

    Research output: Working paperProfessional

    Original languageEnglish
    Place of PublicationEspoo
    Pages187
    Publication statusPublished - 2000
    MoE publication typeD4 Published development or research report or study

    Publication series

    NameThe XXXIV Annual Conference of the Finnish Physical Society, Espoo, Finland, March 9-11,2000

    Keywords

    • perfect crystal
    • silicon
    • synchrotron x-ray
    • topography

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