Synchrotron X-Ray topographic analysis of globally available SiC wafers

Patric J. McNally, Ian Brazil, Lisa "O'Reilly", Andreas Danilewsky, Turkka O. Tuomi, Aapo Lankinen, Antti Säynätjoki, Stanislav Soloviev, Larry B. Rowland, Peter M. Sandvik

    Research output: Chapter in Book/Report/Conference proceedingChapterScientificpeer-review

    Original languageEnglish
    Title of host publicationHASYLAB Annual Report 2006 Part I
    Place of PublicationHamburg, Germany
    PublisherHamburger Synchrotronstrahlungslabor HASYLAB at Deutsches Elektronen-Synchrotron DESY
    Pages743-744
    Publication statusPublished - 2007
    MoE publication typeA3 Part of a book or another research book

    Keywords

    • SiC
    • synchrotron topography

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