@inbook{d6a2b6e7ef0a481e90203aa5983afdbf,
title = "Synchrotron X-Ray topographic analysis of globally available SiC wafers",
keywords = "SiC, synchrotron topography, SiC, synchrotron topography, SiC, synchrotron topography",
author = "McNally, {Patric J.} and Ian Brazil and Lisa {"}O'Reilly{"} and Andreas Danilewsky and Tuomi, {Turkka O.} and Aapo Lankinen and Antti S{\"a}yn{\"a}tjoki and Stanislav Soloviev and Rowland, {Larry B.} and Sandvik, {Peter M.}",
year = "2007",
language = "English",
pages = "743--744",
booktitle = "HASYLAB Annual Report 2006 Part I",
publisher = "Hamburger Synchrotronstrahlungslabor HASYLAB",
address = "Germany",
}