Synchrotron X-Ray topographic analysis of globally available SiC wafers

Patric J. McNally, Ian Brazil, Lisa "O'Reilly", Andreas Danilewsky, Turkka O. Tuomi, Aapo Lankinen, Antti Säynätjoki, Stanislav Soloviev, Larry B. Rowland, Peter M. Sandvik

    Research output: Chapter in Book/Report/Conference proceedingChapterScientificpeer-review

    Original languageEnglish
    Title of host publicationHASYLAB Annual Report 2006 Part I
    Place of PublicationHamburg, Germany
    PublisherHamburger Synchrotronstrahlungslabor HASYLAB
    Publication statusPublished - 2007
    MoE publication typeA3 Book section, Chapters in research books


    • SiC
    • synchrotron topography

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