Synchrotron section topographic study of defects in InP substrates and quaternary laser structures

T. Tuomi; H. Lipsanen; T. Ranta-aho; J. Partanen; J. A. Lahtinen; E. Monberg; R. A. Logan

doi:10.1016/0022-0248(89)90648-9

Synchrotron section topographic study of defects in InP substrates and quaternary laser structures

T. Tuomi^*, H. Lipsanen, T. Ranta-aho, J. Partanen, J. A. Lahtinen, E. Monberg, R. A. Logan

^*Corresponding author for this work

Department of Applied Physics

Research output: Contribution to journal › Article › Scientific › peer-review

3 Citations (Scopus)

Abstract

Indium phosphide single crystals grown by the liquid encapsulated Czochralski (LEC) and vertical gradient freeze (VFG) techniques have been studied with X-ray diffraction topography using synchrotron radiation. Section topographs show that while the VGF substrates are of a better quality than the LEC ones, the defect level in epitaxial layers is more strongly determined by the quaternary layer composition and lattice mismatch than by threading dislocations from the substrate.

Original language	English
Pages (from-to)	881-887
Number of pages	7
Journal	Journal of Crystal Growth
Volume	96
Issue number	4
DOIs	https://doi.org/10.1016/0022-0248(89)90648-9
Publication status	Published - Aug 1989
MoE publication type	A1 Journal article-refereed

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10.1016/0022-0248(89)90648-9

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abstract = "Indium phosphide single crystals grown by the liquid encapsulated Czochralski (LEC) and vertical gradient freeze (VFG) techniques have been studied with X-ray diffraction topography using synchrotron radiation. Section topographs show that while the VGF substrates are of a better quality than the LEC ones, the defect level in epitaxial layers is more strongly determined by the quaternary layer composition and lattice mismatch than by threading dislocations from the substrate.",

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AU - Tuomi, T.

AU - Lipsanen, H.

AU - Ranta-aho, T.

AU - Partanen, J.

AU - Lahtinen, J. A.

AU - Monberg, E.

AU - Logan, R. A.

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AB - Indium phosphide single crystals grown by the liquid encapsulated Czochralski (LEC) and vertical gradient freeze (VFG) techniques have been studied with X-ray diffraction topography using synchrotron radiation. Section topographs show that while the VGF substrates are of a better quality than the LEC ones, the defect level in epitaxial layers is more strongly determined by the quaternary layer composition and lattice mismatch than by threading dislocations from the substrate.

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ER -

Synchrotron section topographic study of defects in InP substrates and quaternary laser structures

Abstract

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