SXRT evaluation of sapphire wafer quality used for Bragg backscattering mirrors

W.M. Chen, P.J. McNally, Yu.V. "Shvyd'ko", M. Lerche, T. Tuomi, A.N. Danilewsky, J. Kanatharana, D. Lowney, M. "O'Hare", L. Knuuttila, J. Riikonen, R. Rantamäki

    Research output: Working paperProfessional

    Original languageEnglish
    Place of PublicationHampuri
    Publication statusPublished - 2001
    MoE publication typeD4 Published development or research report or study

    Publication series

    NameHASYLAB-DESY Annual Report 2000, Part I


    • sapphire
    • synchrotron topography

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