@techreport{c6b9a9640bc84083a9cdce7cbc92e5de,
title = "SXRT evaluation of sapphire wafer quality used for Bragg backscattering mirrors",
keywords = "sapphire, synchrotron topography, sapphire, synchrotron topography, sapphire, synchrotron topography",
author = "W.M. Chen and P.J. McNally and Yu.V. {"}Shvyd'ko{"} and M. Lerche and T. Tuomi and A.N. Danilewsky and J. Kanatharana and D. Lowney and M. {"}O'Hare{"} and L. Knuuttila and J. Riikonen and R. Rantam{\"a}ki",
year = "2001",
language = "English",
series = "HASYLAB-DESY Annual Report 2000, Part I",
pages = "887--888",
type = "WorkingPaper",
}