Abstract
In this work, we investigate variations of surface potentials along a single gallium phosphide (GaP) nanowire (NW) synthesized with a mixed crystal phase along the growth direction. GaP NWs synthesized with both wurtzite (WZ) and zincblende (ZB) phases were studied. The measurements were performed on a standard Atomic Force Microscopy (AFM) set-up equipped with Kelvin Probe Force Microscopy (KPFM) module in PeakForce Tapping Mode. KPFM Measurements from two structures were analyzed. Variations of surface poten-tials were observed in a single GaP NW with WZ/ZB segments. An average difference in surface potential was 55±11 mV. This is explained by different crystal structures along the NW. The work expands the understanding of crystal structure-dependent electrical transport properties of GaP NWs.
Original language | English |
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Article number | 044018 |
Number of pages | 6 |
Journal | Journal of Physics: Conference Series |
Volume | 1400 |
DOIs | |
Publication status | Published - 2019 |
MoE publication type | A4 Conference publication |
Event | International Conference on PhysicA.SPb - Saint Petersburg, Russian Federation Duration: 22 Oct 2019 → 24 Oct 2019 |
Keywords
- Atomic Force Microscopy (AFM)
- Nanowires (NWs)
- Kelvin Probe Force Microscopy (KPFM)
- Wurzite (WZ)
- Zincblende (ZB)
- Gallium phosphide (GaP)
- WURTZITE