Surface Defect Detection with Histogram-Based Texture Features

J. Iivarinen

    Research output: Chapter in Book/Report/Conference proceedingConference contributionScientificpeer-review

    37 Citations (Scopus)
    Original languageEnglish
    Title of host publicationIntelligent Robots and Computer Vision XIX: Algorithms, Techniques, and Active Vision, Proc. SPIE 4197, 2000
    Pages140-145
    Publication statusPublished - 2000
    MoE publication typeA4 Article in a conference publication

    Keywords

    • co-occurrence matrix
    • defect detection
    • local binary pattern
    • self-organizing map
    • texture segmentation
    • unsupervised segmentation

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