TY - GEN
T1 - Surface Defect Detection with Histogram-Based Texture Features
AU - Iivarinen, J.
PY - 2000
Y1 - 2000
KW - co-occurrence matrix
KW - defect detection
KW - local binary pattern
KW - self-organizing map
KW - texture segmentation
KW - unsupervised segmentation
KW - co-occurrence matrix
KW - defect detection
KW - local binary pattern
KW - self-organizing map
KW - texture segmentation
KW - unsupervised segmentation
KW - co-occurrence matrix
KW - defect detection
KW - local binary pattern
KW - self-organizing map
KW - texture segmentation
KW - unsupervised segmentation
M3 - Conference contribution
SP - 140
EP - 145
BT - Intelligent Robots and Computer Vision XIX: Algorithms, Techniques, and Active Vision, Proc. SPIE 4197, 2000
ER -