Study of xenon thermal migration in sintered titanium nitride using nuclear micro-probe

R. Bes*, N. Millard-Pinard, S. Gavarini, S. Cardinal, V. Garnier, H. Khodja, A. Malchère, P. Martin, C. Peaucelle

*Corresponding author for this work

Research output: Contribution to journalArticleScientificpeer-review

6 Citations (Scopus)


Micro-Rutherford backscattering spectrometry experiments were performed on a set of sintered titanium nitride samples implanted with xenon to a depth of about 150 nm. Implanted samples were annealed at 1500 °C during 5 h. Xe depth profile and its lateral distribution on the surface were measured. Surface morphology was observed using scanning electron microscopy. The results reveal that the microstructure plays an important role on xenon release. Moreover, the crystalline orientation of each grain could be a key parameter to explain the heterogeneous evolution of the surface during thermal treatments as well as Xe release from surface.

Original languageEnglish
Pages (from-to)1880-1883
Number of pages4
JournalNuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms
Issue number11-12
Publication statusPublished - 1 Jun 2010
MoE publication typeA1 Journal article-refereed


  • Dislocations
  • Fission product
  • GFR
  • Grain boundary
  • Grain size
  • Inert matrix
  • Oxidation
  • Thermal migration
  • Titanium nitride
  • Xenon


Dive into the research topics of 'Study of xenon thermal migration in sintered titanium nitride using nuclear micro-probe'. Together they form a unique fingerprint.

Cite this