Study of GEM-foil defects with optical scanning system

M. Kalliokoski*, T. Hildén, F. Garcia, R. Lauhakangas, A. Numminen

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contributionScientificpeer-review

8 Citations (Scopus)

Abstract

Deformations can build up in the production stages of the GEM-foils. They can affect the performance of the foils and reduce the lifetime of the detector. With an optical scanning system that we have obtained and developed to improve our quality control system for GEM-detector construction we can locate and study different types of defects on the GEM-foils. We studied standard 100 mm ×100 mm GEM-foils by assembling them as a single-GEM detector with XY-readout and irradiated the areas with defects with X-rays from 55Fe source. In this paper we present the results of these measurements.

Original languageEnglish
Title of host publicationIEEE Nuclear Science Symposium and Medical Imaging Conference, NSS/MIC 2010
Pages1446-1449
Number of pages4
DOIs
Publication statusPublished - 1 Dec 2010
MoE publication typeA4 Article in a conference publication
EventIEEE Nuclear Science Symposium, Medical Imaging Conference (NSS/MIC) and 17th International Workshop on Room-Temperature Semiconductor X-ray and Gamma-ray Detectors (RTSD) - Knoxville, United States
Duration: 30 Oct 20106 Nov 2010

Publication series

NameIEEE Nuclear Science Symposium Conference Record
ISSN (Print)1095-7863

Conference

ConferenceIEEE Nuclear Science Symposium, Medical Imaging Conference (NSS/MIC) and 17th International Workshop on Room-Temperature Semiconductor X-ray and Gamma-ray Detectors (RTSD)
CountryUnited States
CityKnoxville
Period30/10/201006/11/2010

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