TY - GEN
T1 - Study of GEM-foil defects with optical scanning system
AU - Kalliokoski, M.
AU - Hildén, T.
AU - Garcia, F.
AU - Lauhakangas, R.
AU - Numminen, A.
PY - 2010/12/1
Y1 - 2010/12/1
N2 - Deformations can build up in the production stages of the GEM-foils. They can affect the performance of the foils and reduce the lifetime of the detector. With an optical scanning system that we have obtained and developed to improve our quality control system for GEM-detector construction we can locate and study different types of defects on the GEM-foils. We studied standard 100 mm ×100 mm GEM-foils by assembling them as a single-GEM detector with XY-readout and irradiated the areas with defects with X-rays from 55Fe source. In this paper we present the results of these measurements.
AB - Deformations can build up in the production stages of the GEM-foils. They can affect the performance of the foils and reduce the lifetime of the detector. With an optical scanning system that we have obtained and developed to improve our quality control system for GEM-detector construction we can locate and study different types of defects on the GEM-foils. We studied standard 100 mm ×100 mm GEM-foils by assembling them as a single-GEM detector with XY-readout and irradiated the areas with defects with X-rays from 55Fe source. In this paper we present the results of these measurements.
UR - http://www.scopus.com/inward/record.url?scp=79960297012&partnerID=8YFLogxK
U2 - 10.1109/NSSMIC.2010.5874011
DO - 10.1109/NSSMIC.2010.5874011
M3 - Conference contribution
AN - SCOPUS:79960297012
SN - 9781424491063
T3 - IEEE Nuclear Science Symposium Conference Record
SP - 1446
EP - 1449
BT - IEEE Nuclear Science Symposium and Medical Imaging Conference, NSS/MIC 2010
T2 - IEEE Nuclear Science Symposium, Medical Imaging Conference (NSS/MIC) and 17th International Workshop on Room-Temperature Semiconductor X-ray and Gamma-ray Detectors (RTSD)
Y2 - 30 October 2010 through 6 November 2010
ER -