Structural study of crystal defects in thin GaP layers on (100) silicon substrates by X-ray diffraction

Research output: Chapter in Book/Report/Conference proceedingConference contributionScientificpeer-review


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Original languageEnglish
Title of host publicationXXI International materials research congress,Cancun, Mexico, August 12 - 17, 2012
Publication statusPublished - 2012
MoE publication typeA4 Article in a conference publication

ID: 669641