Structural Metrology of SWCNTs by Electron Diffraction

Research output: Chapter in Book/Report/Conference proceedingConference contributionScientificpeer-review

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Original languageEnglish
Title of host publicationFirst International forum on metrology, standardization and industrial quality of nanotube, Rio de Janeiro, Brazil, June 22, 2007
EditorsProf. Ado Jorio
Publication statusPublished - 2007
MoE publication typeA4 Article in a conference publication

    Research areas

  • carbon nanotube, chirality, metrology, structure

ID: 3661410