Structural Metrology of SWCNTs by Electron Diffraction

Research output: Chapter in Book/Report/Conference proceedingConference contributionScientificpeer-review


Research units


Original languageEnglish
Title of host publicationFirst International forum on metrology, standardization and industrial quality of nanotube, Rio de Janeiro, Brazil, June 22, 2007
EditorsProf. Ado Jorio
Publication statusPublished - 2007
MoE publication typeA4 Article in a conference publication

    Research areas

  • carbon nanotube, chirality, metrology, structure

ID: 3661410