Structural Metrology of SWCNTs by Electron Diffraction

Hua Jiang, Albert G. Nasibulin, David P. Brown, Delphine Chassaing, Esko I. Kauppinen

Research output: Chapter in Book/Report/Conference proceedingConference contributionScientificpeer-review

Original languageEnglish
Title of host publicationFirst International forum on metrology, standardization and industrial quality of nanotube, Rio de Janeiro, Brazil, June 22, 2007
EditorsProf. Ado Jorio
Publication statusPublished - 2007
MoE publication typeA4 Article in a conference publication

Keywords

  • carbon nanotube
  • chirality
  • metrology
  • structure

Cite this

Jiang, H., Nasibulin, A. G., Brown, D. P., Chassaing, D., & Kauppinen, E. I. (2007). Structural Metrology of SWCNTs by Electron Diffraction. In P. Ado Jorio (Ed.), First International forum on metrology, standardization and industrial quality of nanotube, Rio de Janeiro, Brazil, June 22, 2007