Statistical distances of measurements for quality control

Vesa Hasu

Research output: Chapter in Book/Report/Conference proceedingConference contributionScientificpeer-review

Original languageEnglish
Title of host publication2011 IEEE INTERNATIONAL SYSTEMS CONFERENCE, Montreal, Canada, April 4-7, 2011
Place of PublicationMontreal, Canada
PublisherIEEE
Pages244-249
ISBN (Electronic)978-1-4244-9492-7
Publication statusPublished - 2011
MoE publication typeA4 Article in a conference publication

Publication series

NameAnnual IEEE Systems Conference
ISSN (Print)1944-7620

Keywords

  • quality management
  • system reliability

Cite this