Start-Up Robustness Against Resonator-Qs Defects in a 2-GHz FBAR VCO

Kim Östman, Mikko Valkama

    Research output: Chapter in Book/Report/Conference proceedingConference contributionProfessional

    Original languageEnglish
    Title of host publicationIEEE International Frequency Control Sympoium, Baltimore, MD, USA, 21-24 May 2012
    Pages221-224
    ISBN (Electronic)978-1-4577-1820-5
    DOIs
    Publication statusPublished - 2012
    MoE publication typeD3 Professional conference proceedings

    Keywords

    • failure analysis
    • film bulk acoustic resonators
    • integrated circuits
    • oscillators
    • pole-zero analysis
    • root locus

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