Abstract
Films of single-walled carbon nanotubes are promising for various electro-optical applications. Their engineering at the nanoscale requires a robust method of the contactless, non-invasive determination of structural properties. Here we present a study that uses specular reflectometry for this purpose, namely to determine the film thickness. Analysis of the reflection coefficient of neutrons, as well as X-rays, makes it possible to obtain a normal density profile and thereby trace the effect of densification of films of single-walled carbon nanotubes by ethanol drop casting. The paper summarizes the first experience of using combined neutron and X-ray approach in relation to low-density carbon films. Further steps for the development of the technique are discussed.
| Original language | English |
|---|---|
| Pages (from-to) | 773-776 |
| Number of pages | 4 |
| Journal | Journal of Surface Investigation: X-Ray, Synchrotron and Neutron Techniques |
| Volume | 15 |
| Issue number | 4 |
| DOIs | |
| Publication status | Published - Jul 2021 |
| MoE publication type | A1 Journal article-refereed |
Funding
This work was supported by the Ministry of Science and Higher Education of the Russian Federation (project no. FZSR-2020-0007 within the framework of the state assignment no. 075-03-2020-097/1). The measurements based on the FLNP JINR infrastructure are also gratefully acknowledged.
Keywords
- aerosol chemical vapor deposition
- neutron reflectometry
- single-walled carbon nanotubes
- thin films
- X-ray reflectometry
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