Abstract
Films of single-walled carbon nanotubes are promising for various electro-optical applications. Their engineering at the nanoscale requires a robust method of the contactless, non-invasive determination of structural properties. Here we present a study that uses specular reflectometry for this purpose, namely to determine the film thickness. Analysis of the reflection coefficient of neutrons, as well as X-rays, makes it possible to obtain a normal density profile and thereby trace the effect of densification of films of single-walled carbon nanotubes by ethanol drop casting. The paper summarizes the first experience of using combined neutron and X-ray approach in relation to low-density carbon films. Further steps for the development of the technique are discussed.
Original language | English |
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Pages (from-to) | 773-776 |
Number of pages | 4 |
Journal | Journal of Surface Investigation |
Volume | 15 |
Issue number | 4 |
DOIs | |
Publication status | Published - Jul 2021 |
MoE publication type | A1 Journal article-refereed |
Keywords
- aerosol chemical vapor deposition
- neutron reflectometry
- single-walled carbon nanotubes
- thin films
- X-ray reflectometry