Spatially resolved electrical characterization of InGaAs/GaAs quantum dot structures

T. Hakkarainen, O. Douheret, S. Norell, S. Anand, L. Fu, C. Jagadish

    Research output: Chapter in Book/Report/Conference proceedingConference contributionScientificpeer-review

    Original languageEnglish
    Title of host publication17th International Vacuum congress, 2.-6.7.2007, Tukholma, Ruotsi
    Publication statusPublished - 2007
    MoE publication typeA4 Article in a conference publication

    Keywords

    • quantum dots
    • scanning spreading resistance microscopy

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