Significant minority carrier lifetime improvement in red edge zone in n-type multicrystalline silicon

Ville Vähänissi, Marko Yli-Koski, Antti Haarahiltunen, Heli Talvitie, Yameng Bao, Hele Savin

Research output: Contribution to journal › Article › Scientific › peer-review

13 Citations (Scopus)
207 Downloads (Pure)

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