Abstract
Novel solar cell materials consisting of Si nanoparticles embedded in SiO2 layers have been studied using positron annihilation spectroscopy in Doppler broadening mode and photoluminescence. Two positron-trapping interface states are observed after high temperature annealing at 1100 °C. One of the states is attributed to the (SiO2/Si bulk) interface and the other to the interface between the Si nanoparticles and SiO2. A small reduction in positron trapping into these states is observed after annealing the samples in N2 atmosphere with 5% H2. Enhanced photoluminescence is also observed from the samples following this annealing step.
Original language | English |
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Article number | 164316 |
Pages (from-to) | 1-4 |
Number of pages | 4 |
Journal | Journal of Applied Physics |
Volume | 114 |
Issue number | 16 |
DOIs | |
Publication status | Published - 2013 |
MoE publication type | A1 Journal article-refereed |
Keywords
- nanoparticle
- positron
- silicon
- silicon dioxide
- solar cell