Shock impact reliability characterization of a handheld product in accelerated tests and use environment

Juha Karppinen, Jue Li, Jyri Pakarinen, Toni Mattila, Mervi Paulasto-Kröckel

Research output: Contribution to journalArticleScientificpeer-review

26 Citations (Scopus)
Original languageEnglish
Pages (from-to)190-198
JournalMicroelectronics Reliability
Volume52
Issue number1
DOIs
Publication statusPublished - 2012
MoE publication typeA1 Journal article-refereed

Keywords

  • accelerated tests
  • acoustic excitation
  • board design
  • board-level
  • commercial components
  • drop test
  • drop testing
  • hand held device
  • impact loadings
  • impact response
  • mechanical shock
  • reliability characterization
  • solder interconnections

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