@techreport{9d0bf6253b74403fba209f41e4bcd49c,
title = "Shape-Based Co-occurrence Matrices for Defect Classification",
keywords = "contour co-occurrence matrix, defect classification, edge co-occurrence matrix, shape descriptor, contour co-occurrence matrix, defect classification, edge co-occurrence matrix, shape descriptor, contour co-occurrence matrix, defect classification, edge co-occurrence matrix, shape descriptor",
author = "R. Rautkorpi and J. Iivarinen",
year = "2005",
language = "English",
series = "14th Scandinavian Conference on Image Analysis, LNCS 3540, Joensuu, Finland, June 19-22, 2005",
publisher = "Springer",
pages = "588--597",
type = "WorkingPaper",
institution = "Springer",
}