SFM and SIMS study of tribofilms growing on TiN coatings during an elevated temperature wear test

Kaj Pischow; A.S. Korhonen; E.O. Ristolainen

SFM and SIMS study of tribofilms growing on TiN coatings during an elevated temperature wear test

Kaj Pischow, A.S. Korhonen, E.O. Ristolainen

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Scientific › peer-review

Original language	English
Title of host publication	Int. Conf. on Advances in Materials Processing Technologies, Dublin, Ireland, Aug. 24-27, 1993
Place of Publication	Ireland
Pages	1887-1895
Publication status	Published - 1993
MoE publication type	A4 Article in a conference publication

Keywords

secondary ion mass spectroscopy (SIMS)
SFM
TiN coated

Cite this

@inproceedings{2fb158dc499848d29fdb4ce6f151df70,

title = "SFM and SIMS study of tribofilms growing on TiN coatings during an elevated temperature wear test",

keywords = "secondary ion mass spectroscopy (SIMS), SFM, TiN coated, secondary ion mass spectroscopy (SIMS), SFM, TiN coated, secondary ion mass spectroscopy (SIMS), SFM, TiN coated",

author = "Kaj Pischow and A.S. Korhonen and E.O. Ristolainen",

year = "1993",

language = "English",

pages = "1887--1895",

booktitle = "Int. Conf. on Advances in Materials Processing Technologies, Dublin, Ireland, Aug. 24-27, 1993",

}

SFM and SIMS study of tribofilms growing on TiN coatings during an elevated temperature wear test. / Pischow, Kaj; Korhonen, A.S.; Ristolainen, E.O.

Int. Conf. on Advances in Materials Processing Technologies, Dublin, Ireland, Aug. 24-27, 1993. Ireland, 1993. p. 1887-1895.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Scientific › peer-review

TY - GEN

T1 - SFM and SIMS study of tribofilms growing on TiN coatings during an elevated temperature wear test

AU - Pischow, Kaj

AU - Korhonen, A.S.

AU - Ristolainen, E.O.

PY - 1993

Y1 - 1993

KW - secondary ion mass spectroscopy (SIMS)

KW - SFM

KW - TiN coated

KW - secondary ion mass spectroscopy (SIMS)

KW - SFM

KW - TiN coated

KW - secondary ion mass spectroscopy (SIMS)

KW - SFM

KW - TiN coated

M3 - Conference contribution

SP - 1887

EP - 1895

BT - Int. Conf. on Advances in Materials Processing Technologies, Dublin, Ireland, Aug. 24-27, 1993

CY - Ireland

ER -