Setup for shot noise measurements in carbon nanotubes

Fan Wu; Leif Roschier; Taku Tsuneta; Mikko Paalanen; Taihong Wang; Pertti Hakonen

doi:10.1063/1.2355263

Setup for shot noise measurements in carbon nanotubes

Fan Wu, Leif Roschier, Taku Tsuneta, Mikko Paalanen, Taihong Wang, Pertti Hakonen

Department of Applied Physics

Chinese Academy of Sciences

Research output: Chapter in Book/Report/Conference proceeding › Conference article in proceedings › Scientific › peer-review

16 Citations (Scopus)

Abstract

We have constructed a noise measurement setup for high impedance carbon nanotube samples. Our setup, working in the frequency range of 600 – 900 MHz, takes advantage of the fact that the shot noise power is reasonably large for high impedance sources so that relatively large, fixed non‐matching conditions can be tolerated.

Original language	English
Title of host publication	24th International Conference on Low Temperature Physics, Orlando, Florida, USA, August 10-17.2005
Editors	Y. et al. Takana
Publisher	American Institute of Physics
Pages	1482-1483
Number of pages	2
ISBN (Electronic)	0-7354-0348-1
ISBN (Print)	0-7354-0347-3
DOIs	https://doi.org/10.1063/1.2355263
Publication status	Published - 2006
MoE publication type	A4 Conference publication
Event	International Conference on Low Temperature Physics - Orlando, United States Duration: 10 Aug 2005 → 17 Aug 2005 Conference number: 24

Publication series

Name	AIP conference proceedings
Publisher	AIP
Number	1
Volume	850
ISSN (Print)	0094-243X

Conference

Conference	International Conference on Low Temperature Physics
Abbreviated title	LT
Country/Territory	United States
City	Orlando
Period	10/08/2005 → 17/08/2005

Keywords

carbon nanotubes
mirowave frequency
shot noise

Access to Document

10.1063/1.2355263

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Wu, F., Roschier, L., Tsuneta, T., Paalanen, M., Wang, T., & Hakonen, P. (2006). Setup for shot noise measurements in carbon nanotubes. In Y. E. A. Takana (Ed.), 24th International Conference on Low Temperature Physics, Orlando, Florida, USA, August 10-17.2005 (pp. 1482-1483). (AIP conference proceedings; Vol. 850, No. 1). American Institute of Physics. https://doi.org/10.1063/1.2355263

@inproceedings{535b4ef93367456da8e179507e57fee1,

title = "Setup for shot noise measurements in carbon nanotubes",

abstract = "We have constructed a noise measurement setup for high impedance carbon nanotube samples. Our setup, working in the frequency range of 600 – 900 MHz, takes advantage of the fact that the shot noise power is reasonably large for high impedance sources so that relatively large, fixed non‐matching conditions can be tolerated.",

keywords = "carbon nanotubes, mirowave frequency, shot noise, carbon nanotubes, mirowave frequency, shot noise, carbon nanotubes, mirowave frequency, shot noise",

author = "Fan Wu and Leif Roschier and Taku Tsuneta and Mikko Paalanen and Taihong Wang and Pertti Hakonen",

year = "2006",

doi = "10.1063/1.2355263",

language = "English",

isbn = "0-7354-0347-3",

series = "AIP conference proceedings",

publisher = "American Institute of Physics",

number = "1",

pages = "1482--1483",

editor = "Takana, {Y. et al.}",

booktitle = "24th International Conference on Low Temperature Physics, Orlando, Florida, USA, August 10-17.2005",

address = "United States",

note = "International Conference on Low Temperature Physics, LT ; Conference date: 10-08-2005 Through 17-08-2005",

}

Wu, F, Roschier, L, Tsuneta, T, Paalanen, M, Wang, T & Hakonen, P 2006, Setup for shot noise measurements in carbon nanotubes. in YEA Takana (ed.), 24th International Conference on Low Temperature Physics, Orlando, Florida, USA, August 10-17.2005. AIP conference proceedings, no. 1, vol. 850, American Institute of Physics, pp. 1482-1483, International Conference on Low Temperature Physics, Orlando, Florida, United States, 10/08/2005. https://doi.org/10.1063/1.2355263

Setup for shot noise measurements in carbon nanotubes. / Wu, Fan; Roschier, Leif; Tsuneta, Taku et al.
24th International Conference on Low Temperature Physics, Orlando, Florida, USA, August 10-17.2005. ed. / Y. et al. Takana. American Institute of Physics, 2006. p. 1482-1483 (AIP conference proceedings; Vol. 850, No. 1).

Research output: Chapter in Book/Report/Conference proceeding › Conference article in proceedings › Scientific › peer-review

TY - GEN

T1 - Setup for shot noise measurements in carbon nanotubes

AU - Wu, Fan

AU - Roschier, Leif

AU - Tsuneta, Taku

AU - Paalanen, Mikko

AU - Wang, Taihong

AU - Hakonen, Pertti

N1 - Conference code: 24

PY - 2006

Y1 - 2006

N2 - We have constructed a noise measurement setup for high impedance carbon nanotube samples. Our setup, working in the frequency range of 600 – 900 MHz, takes advantage of the fact that the shot noise power is reasonably large for high impedance sources so that relatively large, fixed non‐matching conditions can be tolerated.

AB - We have constructed a noise measurement setup for high impedance carbon nanotube samples. Our setup, working in the frequency range of 600 – 900 MHz, takes advantage of the fact that the shot noise power is reasonably large for high impedance sources so that relatively large, fixed non‐matching conditions can be tolerated.

KW - carbon nanotubes

KW - mirowave frequency

KW - shot noise

KW - carbon nanotubes

KW - mirowave frequency

KW - shot noise

KW - carbon nanotubes

KW - mirowave frequency

KW - shot noise

U2 - 10.1063/1.2355263

DO - 10.1063/1.2355263

M3 - Conference article in proceedings

SN - 0-7354-0347-3

T3 - AIP conference proceedings

SP - 1482

EP - 1483

BT - 24th International Conference on Low Temperature Physics, Orlando, Florida, USA, August 10-17.2005

A2 - Takana, Y. et al.

PB - American Institute of Physics

T2 - International Conference on Low Temperature Physics

Y2 - 10 August 2005 through 17 August 2005

ER -

Setup for shot noise measurements in carbon nanotubes

Abstract

Publication series

Conference

Keywords

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