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Semiconductor parameter extraction via current-voltage characterization and Bayesian inference methods
Rachel C. Kurchin, Jeremy R. Poindexter, Daniil Kitchaev, Ville Vähänissi, Carlos Del Cañizo, Liu Zhe, Hannu S. Laine, Chris Roat, Sergiu Levcenco, Gerbrand Ceder, Tonio Buonassisi
Research output: Chapter in Book/Report/Conference proceeding › Conference article in proceedings › Scientific › peer-review
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