Projects per year
Abstract
Mobility fluctuations have been observed to influence 1 / f noise in mesoscopic two-dimensional conductors in recent experiments. If such mobility noise can be assigned to clustering/declustering of defects/impurities, the second spectrum should also display 1 / f character. In this work, we investigate the second spectrum of noise due to mobile impurities on a two-dimensional lattice both using kinetic Monte Carlo simulations (periodic boundary conditions either in one or two directions) and experiments on suspended graphene in Corbino geometry. The simulations indicate 1 / f δ behavior with δ ≃ 0.8 ± 0.15 for the second spectrum of noise, while the experiments on suspended graphene yield an exponent δ ≃ 0.7 ± 0.3 , independent of the amount of adsorbed atoms.
Original language | English |
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Article number | 013509 |
Pages (from-to) | 1-6 |
Number of pages | 6 |
Journal | Applied Physics Letters |
Volume | 123 |
Issue number | 1 |
DOIs | |
Publication status | Published - 3 Jul 2023 |
MoE publication type | A1 Journal article-refereed |
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Dive into the research topics of 'Second spectrum of 1 / f noise due to mobility fluctuations : Simulations vs experiments in suspended graphene'. Together they form a unique fingerprint.Projects
- 5 Finished
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-: European Microkelvin Platform
Hakonen, P. (Principal investigator)
01/01/2019 → 31/12/2023
Project: EU: Framework programmes funding
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Finnish Centre of Excellence in Quantum Technology
Hakonen, P. (Principal investigator), Elo, T. (Project Member), Kumar, M. (Project Member) & Suresh, K. (Project Member)
01/01/2018 → 31/12/2020
Project: Academy of Finland: Other research funding
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1/f noise
Hakonen, P. (Principal investigator), Will, M. (Project Member), Haque, M. (Project Member), Thanniyil Sebastian, A. (Project Member), Kamada, M. (Project Member), Sarkar, J. (Project Member) & Perelshtein, M. (Project Member)
01/09/2017 → 31/08/2021
Project: Academy of Finland: Other research funding
Equipment
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OtaNano – Low Temperature Laboratory
Savin, A. (Manager) & Rissanen, A. (Other)
OtaNanoFacility/equipment: Facility